Research
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Unusual features in trap emission characteristics of heavily damaged silicon induced by MeV ion implantation
Publication · January 27, 2026
Electromagnetic induction and damping: Quantitative experiments using a PC interface
Abstract
A bar magnet, attached to an oscillating system, passes through a coil periodically, generating a series of electromotive force pulses. A novel method for the quantitative verification of Faraday’s law is described which eliminates all ...
Publication · January 27, 2026
Carrier dynamics at Deep traps in ion implanted silicon: Possible signature of defect clusters
Publication · January 27, 2026
Influence of hydrogen plasma treatment on boron implanted junctions in silicon
Publication · January 27, 2026
Size Distribution Of Embedded Nano-Crystallites In Polymorphous Silicon Studied By Raman Spectroscopy And Photoluminescence
Publication · January 27, 2026
Changes in the leakage currents in Ba0.8Sr0.2TiO3/ZrO2 multilayers due to modulations in oxygen concentration
Publication · January 27, 2026
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