Research
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Optical and microstructural characterization of sol/gel derived cerium-doped PZT thin films
Publication · January 27, 2026
Compensating defect in deep buried layers produced by MeV heavy ions in n-silicon
Publication · January 27, 2026
Defect level responsible for compensation in deep buried layers in n-type silicon
Publication · January 27, 2026
CHARGE REDISTRIBUTION AND DEFECT RELAXATION IN HEAVILY DAMAGED SILICON STUDIED USING TIME ANALYZED TRANSIENT SPECTROSCOPY
Publication · January 27, 2026
Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon
Publication · January 27, 2026
Electrical characterization of MeV heavy-ion-induced damage in silicon: Evidence for defect migration and clustering
Publication · January 27, 2026
Challenges and opportunities in studying deep defect dominated semiconductors : Emerging issue and case studies
Publication · January 27, 2026
Time-Temperature-Transformation (TTT) Diagram for SOL-GEL PZT Thin Films
Publication · January 27, 2026